|
Applications
Plasma Diagnostics
Process Monitoring &
Control
Thin Film & Optical
Coating Thickness Measurement
Color Measurement
Develop & Etch End-point
Detection
Process Development
& Characterization
|
Features
Real Time Signal Processing
using User-defined analysis routines
Chemical Identification
using Patented Spectral Library
Key Data stored in SQL
Database
1024 Element PDA
(optional intensifier)
|
